AltiSurf© 575
Developed for high-capacity applications, the AltiSurf© 575 is specifically designed for measuring large and oversized parts. It is perfectly suited for plastic panels, thin glass substrates, plastic sheets, cut or stamped metal sheets, smart cards, as well as electronic components such as silicon or smartphone glasses.
Thanks to its large upper gantry, it allows for easy positioning of heavy loads directly on the granite base, facilitating clamping and enabling automated loading.
Like the AltiSurf© 500, 520, and 530 models, it can integrate multiple types of sensors and different holding systems (balls, vacuum, or air film). It also features a new generation of optical sensors, ideal for multi-sample measurements and complete metrology of dimensions, shape, and thickness.
Its numerous options make it a powerful tool for both R&D and production control.
Measurement Principles:
Confocal Chromatic
Visible and IR Interferometry
Laser Triangulation
Contact Probe
Structural Dimensions:
Weight: 365kg
Dimensions (L x W x H): 1244 x 1205 x 400 mm
Measurement Capacity (X x Y x Z): 750 x 750 x 75 mm
Measurement Ranges:
Axis Speed: Up to 100 mm/s or 45 mm/s
Axis Resolution: 4 µm / 1 µm
Measurement Range: 100 µm to 40 mm
Z Resolution: From 3 nm
Lateral Resolution: From 0.9 µm
Measurement Performance:
Step Height Accuracy (9.4 µm): 0.1%
Roughness Accuracy (Ra 0.3 µm): 0.3%
Minimum Thickness Measurement: 4 µm
Usage Information:
Standards:
ISO 21920
ISO 25178
ISO 4287
Software:
Acquisition: PhéNIX©
Analysis: PheNIX© Map/AltiMap
Specific Information:
Ability to measure all surfaces (rough, transparent, polished...)
Multi-sensor architecture (confocal, interferometric, I/R)
IR Technology: thickness measurement on silicon without suction placement
Optical Measurement: no damage to the measured part
Push-button interface - easy to use